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2009 Statistics and Reliability Meeting Schedule PDF Print E-mail

Our 2009 scheduled speakers and topics:
(all meetings are on the second Wednesday of each month)

MEETING SCHEDULE

Our 2009 scheduled speakers and topics:
(all meetings are on the second Wednesday of each month)

Jan 14- Mr. George Denes – Design for Reliability in the Semiconductor World
Feb 11- Mr. Terry Oldberg – Maximizing Knowledge
Mar 11- Mr. Ed Russell – TBD
Apr 8- DOE Panel Discussion (Bring your questions)
May 13- Mr. Govind Ramu – Innovative approach to FMEA development
Jun 10- Dr. John Flaig – A Unifying Process Capability Metric
Jul 8- Joint ASQ and IEEE Reliability Presentation
Dr. Jack Tomsky and Mr. Joe Stampher - Statistical Analysis of Interval Data
Aug 12- Mr. Lester Wollman – Data Mining
Sep 9- Dr. Carl Mathia – Statistics for Robotics Quality Control
Oct 14- SPC Panel Discussion (Bring your questions)
Nov 11- Mr. Joseph Whitmore and Dr. Jack Tomsky – Using Maximum Likelihood
Estimation for Complex Sampling Problems
and The Annual Speakers Dinner

Dec - No Meeting, Happy Holidays!

 
Statistics & Reliability Discussion Group Meeting Feb 10 PDF Print E-mail

Friends,
Please forward this invitation to your colleagues, and RSVP to
me ( This e-mail address is being protected from spam bots, you need JavaScript enabled to view it ) if you plan to attend.

The Statistics & Reliability Discussion Group cordially invites you to
attend an outstanding FREE presentation:

Speaker: Mr. Fred Schenkelberg

Topic: Equipment Availability based on Reliability Analysis

Abstract:

Tracking bottling equipment line uptime and downtime is a
common metric for bottling production lines. The runtime
and downtime along with reasons for being down are routinely
and semi automatically recorded. The data is often summarized
using the exponential distribution and reported as MTBF and MTTR.

During the design of a new bottling line, the team used the
recorded data from existing lines and equipment to estimate
the proposed line availability. If the new line could shorten
the run time to accommodate a high mix of products and
improve the line availability and thus throughput, the new
line would permit significant warehouse savings.

The experienced operator, maintenance and engineering teams
knew that the line availability improved as the run duration
increased. After the initial setup, the line operator and
maintenance teams continued to adjust and improve the
operation of the bottling line, thus, overtime improving the
line availability. It was not a constant value independent of
the run duration. And, the existing calculations based on
MTBF and MTTR did not reflect this behavior.

This presentation examines the use of expected values of the
fitted distributions for uptime and downtime, rather than
using MTBF and MTTR. The expected values permit the analysis
to study the changes in availability as the run duration changes.
The result was the design team's analysis could tradeoff the
run duration and associated throughput with the expected
warehouse requirements and cost savings for an optimal
bottling line design. This paper primarily explores the equipment
analysis and availability calculations.

Biography:

Fred joined the ranks of independent consultants to focus on
reliability engineering in 2004. He currently works with a wide
variety of clients using reliability assessments as a starting
point to develop detailed reliability plans and programs.
Also, he uses his reliability engineering and statistical knowledge
to design and conduct accelerated life tests.

Fred previously worked at HP starting in Vancouver, WA. He later
joined HP's Electronic System Technology Center in Palo Alto, CA,
in January 1998 and co-founded the HP Product Reliability Team.
In that role, Fred was responsible for the consulting, training,
and community building aspects of HP's Product Reliability Program.
He was also responsible for research and development on selected
products reliability management topics at HP.

Prior to joining HP's ESTC, he worked as a design for manufacturing
engineer on DeskJet printers. Before HP he worked with Raychem
Corporation in various positions, including research and development
of accelerated life testing of polymer based heating cables.

He has a Bachelors of Science in Physics from the United States
Military Academy and a Masters of Science in Statistics from Stanford
University. Fred is an active member of the RAMS Management
Committee and currently the IEEE Reliability Society Santa Clara
Valley Chapter Vice President and ASQ Reliability Division Chair.

(408) 710-8248
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http://www.fmsreliability.com

Please RSVP This e-mail address is being protected from spam bots, you need JavaScript enabled to view it at least two days prior to the
meeting if possible.

Read more...
 
About the Statistics and Reliability Discussion Group PDF Print E-mail

The Statistics Discussion Group is composed of engineers, statisticians, managers, technicians, students, and others who meet each month to explore a variety of statistically related topics. The topics range from the theoretical to the practical in areas such as statistics, reliability, and Six Sigma.

Our group meets on the second Wednesday of each month and attendance is FREE. To see the discussion topic and speaker information for the next meeting, use the link below:
Current discussion topic and speaker info

The meetings are held at:
Applied Materials
Bowers Cafe (aka Campus Cafe)
3090 Bowers Ave.
Santa Clara, CA. 95054 MAP to location

Driving directions are at the end of this page.

If you plan to attend, please RSVP to This e-mail address is being protected from spam bots, you need JavaScript enabled to view it so we can have the badges pre-printed for you.
Meetings start at 6:00 p.m. with a half-hour dedicated to introductions and social interaction. From 6:30 to about 7:30 there is a presentation and then about 30 minutes for Q&A. Pizza and soft drinks will usually be available ($5.00 for Pizza and $1.00 for drinks).


The presenter is a volunteer, usually from one of the Bay Area companies and we make every effort to provide speakers that are recognized experts in their field. Discussions range from the practical to the theoretical as well as from the serious to the amusing. Participation is FREE, so please join us for an interesting and rewarding experience.

If you would like to be added to our monthly meeting newsletter or have access to previous presentations, then please use the link below:
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If you have any questions, contact This e-mail address is being protected from spam bots, you need JavaScript enabled to view it .

Driving directions

From 101 (Going South from Palo Alto):

  • Take the Bowers Ave exit and turn right at the light (i.e., headed west -- away from Great America).
  • Go about 1/2 mile, you will cross Scott Blvd. If you cross Central Expressway, you have gone too far.
  • Turn right at the second driveway after passing Scott Blvd. and park in the multistory car park in the rear.
  • The Bowers Campus Cafe is behind Applied Material's building #2.
From 101 (Going North from San Jose):
  • Take the Great America Parkway exit and turn left at the light (i.e., go west -- away from Great America).
  • Go about 1/2 mile, you will cross Scott Blvd. If you cross Central Expressway, you have gone too far.
  • Turn right at the second driveway after passing Scott Blvd. and park in the multistory car park in the rear.
  • The Bowers Campus Cafe is behind Applied Material's building #2.
 
The Quality Technology Corner PDF Print E-mail

Click on the following link to go to the Quality Technology Corner:

http://www.e-at-usa.com/Flaigcorner.htm

John J. Flaig, Ph.D.
Managing Director
Applied Technology
Tel: 408-266-5174

E-mail: This e-mail address is being protected from spam bots, you need JavaScript enabled to view it

Web: http://www.e-at-usa.com/