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2009 Statistics and Reliability Meeting Schedule PDF Print E-mail

Our 2009 scheduled speakers and topics:
(all meetings are on the second Wednesday of each month)

MEETING SCHEDULE

Our 2009 scheduled speakers and topics:
(all meetings are on the second Wednesday of each month)

Jan 14- Mr. George Denes – Design for Reliability in the Semiconductor World
Feb 11- Mr. Terry Oldberg – Maximizing Knowledge
Mar 11- Mr. Ed Russell – TBD
Apr 8- DOE Panel Discussion (Bring your questions)
May 13- Mr. Govind Ramu – Innovative approach to FMEA development
Jun 10- Dr. John Flaig – A Unifying Process Capability Metric
Jul 8- Joint ASQ and IEEE Reliability Presentation
Dr. Jack Tomsky and Mr. Joe Stampher - Statistical Analysis of Interval Data
Aug 12- Mr. Lester Wollman – Data Mining
Sep 9- Dr. Carl Mathia – Statistics for Robotics Quality Control
Oct 14- SPC Panel Discussion (Bring your questions)
Nov 11- Mr. Joseph Whitmore and Dr. Jack Tomsky – Using Maximum Likelihood
Estimation for Complex Sampling Problems
and The Annual Speakers Dinner

Dec - No Meeting, Happy Holidays!

 
Statistics & Reliability Group Meeting: August 11 PDF Print E-mail

Statistics & Reliability Discussion Meeting: August 11
Friends,

Please forward this invitation to your colleagues, and RSVP to
me ( This e-mail address is being protected from spam bots, you need JavaScript enabled to view it ) if you plan to attend.

The Statistics & Reliability Discussion Group cordially invites you to
attend an outstanding FREE presentation:

Topic: Multiple Comparisons of Binomials with Applications
to The Super Bowl Theory

Speaker: Dr. Jack Tomsky

Host: Dr. John Flaig

Abstract:

Whereas a hypothesis test gives a yes or no dichotomous decision
as to whether the null hypothesis should be accepted, the inversion
into a confidence region give a corresponding quantitative measure
for the parameter in question.  By formulating the null hypothesis
as the intersection of a set of component hypotheses, a set of
simultaneous confidence intervals (that is, multiple comparisons)
is constructed.
 
Multiple comparisons is a tool for determining which comparisons
are responsible for the overall test of a null hypothesis being rejected.  
This talk extends the application of this concept from the well-known
ANOVA comparison of normal means to a comparison of several
binomial distributions.
 
The technique is then applied to the Super Bowl Theory, a theory
which predicts whether the stock market will rise or fall for the
year depending on the outcome of the Super Bowl football game.

Biography:

Jack Tomsky is a statistical consultant.  He wrote his Stanford PhD

dissertation in multivariate analysis.  Dr. Tomsky worked for

Bristol-Myers, IBM, Lockheed-Martin, and Dade Behring in a previous life.

Please RSVP
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Read more...
 
About the Statistics and Reliability Discussion Group PDF Print E-mail

The Statistics Discussion Group is composed of engineers, statisticians, managers, technicians, students, and others who meet each month to explore a variety of statistically related topics. The topics range from the theoretical to the practical in areas such as statistics, reliability, and Six Sigma.

Our group meets on the second Wednesday of each month and attendance is FREE. To see the discussion topic and speaker information for the next meeting, use the link below:
Current discussion topic and speaker info

The meetings are held at:
Applied Materials
Bowers Cafe (aka Campus Cafe)
3090 Bowers Ave.
Santa Clara, CA. 95054 MAP to location

Driving directions are at the end of this page.

If you plan to attend, please RSVP to This e-mail address is being protected from spam bots, you need JavaScript enabled to view it so we can have the badges pre-printed for you.
Meetings start at 6:00 p.m. with a half-hour dedicated to introductions and social interaction. From 6:30 to about 7:30 there is a presentation and then about 30 minutes for Q&A. Pizza and soft drinks will usually be available ($5.00 for Pizza and $1.00 for drinks).


The presenter is a volunteer, usually from one of the Bay Area companies and we make every effort to provide speakers that are recognized experts in their field. Discussions range from the practical to the theoretical as well as from the serious to the amusing. Participation is FREE, so please join us for an interesting and rewarding experience.

If you would like to be added to our monthly meeting newsletter or have access to previous presentations, then please use the link below:
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If you have any questions, contact This e-mail address is being protected from spam bots, you need JavaScript enabled to view it .

Driving directions

From 101 (Going South from Palo Alto):

  • Take the Bowers Ave exit and turn right at the light (i.e., headed west -- away from Great America).
  • Go about 1/2 mile, you will cross Scott Blvd. If you cross Central Expressway, you have gone too far.
  • Turn right at the second driveway after passing Scott Blvd. and park in the multistory car park in the rear.
  • The Bowers Campus Cafe is behind Applied Material's building #2.
From 101 (Going North from San Jose):
  • Take the Great America Parkway exit and turn left at the light (i.e., go west -- away from Great America).
  • Go about 1/2 mile, you will cross Scott Blvd. If you cross Central Expressway, you have gone too far.
  • Turn right at the second driveway after passing Scott Blvd. and park in the multistory car park in the rear.
  • The Bowers Campus Cafe is behind Applied Material's building #2.
 
The Quality Technology Corner PDF Print E-mail

Click on the following link to go to the Quality Technology Corner:

http://www.e-at-usa.com/Flaigcorner.htm

John J. Flaig, Ph.D.
Managing Director
Applied Technology
Tel: 408-266-5174

E-mail: This e-mail address is being protected from spam bots, you need JavaScript enabled to view it

Web: http://www.e-at-usa.com/